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  1. DIGILEM - Interferometric Endpoint Detector & Thin Film Monitor

    Interferometry is a powerful technique that can be used for endpoint detection of planar layer and trench etching, or deposition
    plasma2
    semiconductor2
    semiconductors2
    deposition2
    etch1
    interference1
    Sofie1
    endpoint1
    interferometry1
    film thickness1
    interferometers1
    plasma etch1
    end point1
    dry etching1
    thickness monitors1
    dry etch1
    thin film characterisation1
    end point detection1
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    thin film measurements1
    deposition rate1
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    endpointer1
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    end point systems1
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    etch rate1
    thin film monitors1
    Digilem0
    etching control0
    semiconductor characterisation0

    www.digilem.com - 2009-02-08

  2. Bittmann Applied Technologies "Homepage"

    Facility Management Consulting, Semiconductor and thin-film technology
    Plasma2
    Vacuum2
    Semiconductor2
    Used equipment2
    process management1
    sputtering1
    Dry etching1
    SiC components0

    www.bittmann.com - 2009-02-12

  3. Welcome to AxR

    0&&parent.frames.length) { d=parent.frames[n.substring(p+1)].document; n=n.substring(0,p);} if(!(x=d[n])&&d.all) x=d.all[n]; for (i=0;!x&&i Welcome to AxR AxR ...
    inspection3
    nanotechnology2
    semiconductor2
    semiconductors2
    diffusion2
    metrology2
    wafer1
    etch1
    axiom1
    semiconductor manufacturing1
    silicon wafer1
    nanotechnologies1
    lpcvd1
    wafer handling1
    wet processing1
    dry etching1
    semiconductor inspection1
    wet process1
    Thermco1
    dry etch1
    Greg Mills1
    axiom resource technology0
    axrtech0
    axr tech0
    dry deposition0
    hietch0
    hi etch0

    www.axrtech.com - 2009-02-09

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